United States International Trade Commision Rulings And Harmonized Tariff Schedule
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9025.80.50 - 9032.81.00
> 9031.80.40
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HTS Number:
9031.80.40
Description:
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles
MFN Duty Rate:
Free
Previous Tariff (9031.80.00 - Measuring and checking instruments, appliances and machines, nesi)
Next Tariff (9031.80.80 - Measuring and checking instruments, appliances and machines, nesoi)
Related Rulings:
2000 HQ 962435 - Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
2003 HQ 966482 - CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
2004 HQ 966185 - Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
2004 HQ 966296 - Protest 1704-02-100302; CD-Scanning Electron Microscope
2006 NY R03296 - The tariff classification of the Nova 200 NanoLab
2007 NY N013658 - The tariff classification of Expida Dual Beam Semiconductor Apparatus from the Netherlands