United States International Trade Commision Rulings And Harmonized Tariff Schedule
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9025.80.50 - 9032.81.00
> 9031.41.00
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HTS Number:
9031.41.00
Description:
Optical measuring/checking instruments/appliances for inspecting semiconductor wafers/devices or photomasks/reticle used to mfg such devices
MFN Duty Rate:
Free
Previous Tariff (9031.30.00 - Profile projectors)
Next Tariff (9031.49.10 - Profile projectors)
Related Rulings:
1997 NY 817479 - The tariff classification of inspection systems from Belgium
1998 HQ 961003 - Protest 3901-97-101872; Dynamic Test Handlers
1998 NY B89229 - The tariff classification of the WT-85 Lifetime Scanner from Hungary
1998 NY B89495 - The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary
1998 NY C81315 - The tariff classification of Nikon Optistations from Japan.
1999 NY D88817 - The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan
1999 NY D89035 - The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
1999 NY E80052 - The tariff classification of Wafer Auto Loaders from Japan
2001 NY G86065 - The tariff classification of Test Handlers from Switzerland
2002 NY H89484 - The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
2003 HQ 966482 - CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
2004 HQ 966185 - Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.