United States International Trade Commision Rulings And Harmonized Tariff Schedule
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9025.80.50 - 9032.81.00
> 9030.82.00
Previous Tariff (9030.40.00 - Instruments and apparatus specially designed for telecommunications)
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HTS Number:
9030.82.00
Description:
Instruments and apparatus for measuring or checking electrical quantities, nesoi: for measuring or checking semiconductor wafers or devices
MFN Duty Rate:
Free
Previous Tariff (9030.40.00 - Instruments and apparatus specially designed for telecommunications)
Next Tariff (9030.83.00 - Instruments and apparatus for measuring, checking or detecting electrical quantities or ionizing radiations, nesoi: with a recording device)
Related Rulings:
1997 NY A89407 - The tariff classification of semiconductor production and test equipment from Japan.
1998 HQ 961003 - Protest 3901-97-101872; Dynamic Test Handlers
1998 NY C82545 - The tariff classification of Test Burn-in Test Systems from Japan
1998 NY C83148 - The tariff classification of Integrated Circuit Handlers from Japan
1998 NY NY477 - The tariff classification of semiconductor production and test equipment from Japan.
1999 NY E81071 - The tariff classification of Printed Circuit Board Testers from Ireland
2002 HQ 965528 - 3070 In Circuit Test Outsource Series; Testing of Semiconductor Devices
2004 NY K86983 - The tariff classification of Wafer Probers from Japan
2006 NY R04578 - The tariff classification of X-Y In-Circuit Hi-Tester, 1240-02 from Japan
2007 NY N004060 - The tariff classification of Manipulator/Cooling Kiosk Country of Origin Unknown
2007 NY N015714 - The tariff classification of focused ion beam semiconductor manufacturing equipment from the United States